Test tools target faster, denser electronics

Tektronix has unveiled two new products designed for high-speed serial and data center power validation tasks.

The 7 Series DPO now reaches up to 25 GHz with eight channels and a sample rate of 125 GS/s on the four TekConnect channels, or 62.5 GS/s when all eight (TekConnect plus 2.92 mm) are in operation. The 12-bit ADC and QuietChannel active CTLE are designed to maintain ENOB as bandwidth increases, which is beneficial for engineers dealing with jitter and signal integrity margins on high-speed serial links like PCIe and memory bus. The scope also functions as a 26.6 Gbps bit error detector, eliminating the need for a separate box for PRBS pattern debug. Bandwidth can be upgraded from 8 GHz and above, providing flexibility for future needs.

Additionally, the ELR 21000 is a regenerative electronic load tailored for testing next-gen data center power shelves, especially the emerging 800 V architectures. It scales in 30 kW increments up to 1920 kW, supports up to 5120 A, and achieves up to 95% efficiency in returning energy to the microgrid instead of dissipating it as heat. This efficiency not only impacts operational expenses but also reduces cooling requirements in testing environments. Slew rate increases with paralleled units, reaching up to 12 A/µs at 240 kW, crucial for simulating transient current draw in GPU clusters. A 125% short-term overpower rating allows for validation of peak demand spikes without oversizing the setup.

Both products address the common challenge of test equipment struggling to keep up with the speed and power demands of modern systems.


Filed Under: Communications